Our integrated circuits and reference designs help create high-precision automotive test equipment for accurate testing of all automotive subsystems during manufacturing and service of the vehicle.
New generation automotive test equipment requires:
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| Type | Title | Date | ||
|---|---|---|---|---|
| Application note | Signal Chain Noise Figure Analysis | 29 Oct 2014 | ||
| Application note | Principles of Data Acquisition and Conversion (Rev. A) | PDF | HTML | 28 Jun 2018 | |
| Analog Design Journal | Impact of sampling-clock spurs on ADC performance | 23 Jul 2009 | ||
| Application note | 66AK2L06 JESD Attach to ADC12J4000/DAC38J84 Getting Started Guide (Rev. B) | 20 Jun 2016 | ||
| White paper | Voltage-reference impact on total harmonic distortion | 19 Sep 2016 | ||
| Analog Design Journal | Power-supply design for high-speed ADCs (Rev. A) | 18 May 2015 | ||
| White paper | Minimum Power Specifications for High-Performance ADC Power-Supply Designs | 15 Apr 2016 | ||
| Analog Design Journal | JESD204B multi-device synchronization: Breaking down the requirements | 12 May 2015 | ||
| Application note | Clocking Optimization for RF Sampling Analog-to-Digital Converters (Rev. A) | PDF | HTML | 10 May 2022 | |
| White paper | Direct RF conversion: From vision to reality | 05 May 2015 |
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