Product details

Sample rate (max) (Msps) 1500, 3000 Resolution (Bits) 12 Number of input channels 1, 2 Interface type DDR LVDS, Parallel LVDS Analog input BW (MHz) 8000 Features Ultra High Speed Rating Catalog Peak-to-peak input voltage range (V) 0.8 Power consumption (typ) (mW) 2770 Architecture Folding Interpolating SNR (dB) 56.8 ENOB (bit) 9 SFDR (dB) 67 Operating temperature range (°C) -40 to 85 Input buffer Yes
Sample rate (max) (Msps) 1500, 3000 Resolution (Bits) 12 Number of input channels 1, 2 Interface type DDR LVDS, Parallel LVDS Analog input BW (MHz) 8000 Features Ultra High Speed Rating Catalog Peak-to-peak input voltage range (V) 0.8 Power consumption (typ) (mW) 2770 Architecture Folding Interpolating SNR (dB) 56.8 ENOB (bit) 9 SFDR (dB) 67 Operating temperature range (°C) -40 to 85 Input buffer Yes
FCBGA (ACF) 256 289 mm² 17 x 17
  • ADC core:
    • 12-Bit resolution
    • Up to 1GSPS, 3GSPS, 5GSPS in single-channel mode
    • Up to 500MSPS, 1.5GSPS, 2.5GSPS in dual-channel mode
  • Internal dither for low-magnitude, high-order harmonics
  • Low-latency LVDS interface:
    • Total latency: < 10ns
    • Up to 48 data pairs at 1.6Gbps
    • Four DDR data clocks
    • Strobe signals simplify synchronization
  • Noise floor (no input, VFS = 1VPP-DIFF):
    • Dual-channel mode: -143.5, -148, -149.8dBFS/Hz
    • Single-channel mode: -146.2, -150.3, -152.2dBFS/Hz
  • Buffered analog inputs with VCMI of 0V:
    • Analog input bandwidth (–3dB): 8GHz
    • Full-scale input voltage (VFS, default): 0.8VPP
  • Noiseless aperture delay (TAD) adjustment:
    • Precise sampling control: 19fs step
    • Simplifies synchronization and interleaving
    • Temperature and voltage invariant delays
  • Easy-to-use synchronization features:
    • Automatic SYSREF timing calibration
    • Timestamp for sample marking
  • Power consumption: 2.6, 2.8, 3W
  • ADC core:
    • 12-Bit resolution
    • Up to 1GSPS, 3GSPS, 5GSPS in single-channel mode
    • Up to 500MSPS, 1.5GSPS, 2.5GSPS in dual-channel mode
  • Internal dither for low-magnitude, high-order harmonics
  • Low-latency LVDS interface:
    • Total latency: < 10ns
    • Up to 48 data pairs at 1.6Gbps
    • Four DDR data clocks
    • Strobe signals simplify synchronization
  • Noise floor (no input, VFS = 1VPP-DIFF):
    • Dual-channel mode: -143.5, -148, -149.8dBFS/Hz
    • Single-channel mode: -146.2, -150.3, -152.2dBFS/Hz
  • Buffered analog inputs with VCMI of 0V:
    • Analog input bandwidth (–3dB): 8GHz
    • Full-scale input voltage (VFS, default): 0.8VPP
  • Noiseless aperture delay (TAD) adjustment:
    • Precise sampling control: 19fs step
    • Simplifies synchronization and interleaving
    • Temperature and voltage invariant delays
  • Easy-to-use synchronization features:
    • Automatic SYSREF timing calibration
    • Timestamp for sample marking
  • Power consumption: 2.6, 2.8, 3W

The ADC12DL500, ADC12DL1500 and ADC12DL2500 are a family of analog-to-digital converters (ADC) that can sample up to 500MSPS, 1.5GSPS, and 2.5GSPS in dual-channel mode and up to 1GSPS, 3GSPS, and 5GSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and sample rate (single-channel mode) allow development of flexible hardware that meets the needs of both high-channel count or wide instantaneous signal bandwidth applications.

The devices uses a low-latency, low-voltage differential signaling (LVDS) interface for latency sensitive applications or when the simplicity of LVDS is preferred. The interface uses up to 48 data pairs, four double data rate (DDR) clocks, and four strobe signals arranged in four 12-bit data buses. The interface supports signaling rates of up to 1.6Gbps. Strobe signals simplify synchronization across buses and between multiple devices. The strobe is generated internally and can be reset at a deterministic time by the SYSREF input. Multi-device synchronization is further eased by innovative synchronization features such as noiseless aperture delay (TAD) adjustment and SYSREF windowing.

The ADC12DL500, ADC12DL1500 and ADC12DL2500 are a family of analog-to-digital converters (ADC) that can sample up to 500MSPS, 1.5GSPS, and 2.5GSPS in dual-channel mode and up to 1GSPS, 3GSPS, and 5GSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and sample rate (single-channel mode) allow development of flexible hardware that meets the needs of both high-channel count or wide instantaneous signal bandwidth applications.

The devices uses a low-latency, low-voltage differential signaling (LVDS) interface for latency sensitive applications or when the simplicity of LVDS is preferred. The interface uses up to 48 data pairs, four double data rate (DDR) clocks, and four strobe signals arranged in four 12-bit data buses. The interface supports signaling rates of up to 1.6Gbps. Strobe signals simplify synchronization across buses and between multiple devices. The strobe is generated internally and can be reset at a deterministic time by the SYSREF input. Multi-device synchronization is further eased by innovative synchronization features such as noiseless aperture delay (TAD) adjustment and SYSREF windowing.

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* Data sheet ADC12DLx500 0.5, 1.5, 2.5GSPS Dual-Channel or 1, 3, 5GSPS Single-Channel,12-Bit Analog-to-Digital Converters (ADC) With LVDS Interface datasheet PDF | HTML 31 Jan 2024

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Evaluation board

ADC12DL2500EVM — ADC12DL2500 evaluation module

The ADC12DL2500 evaluation module (EVM) is used to evaluate the ADC12DL2500, a 12 bit, dual 2.5GSPS or single 5GSPS, RF-sampling analog-to-digital converter (ADC) with LVDS interface. The EVM has single-ended AC-coupled analog inputs, onboard ADC clock generation and power-conditioning circuitry. (...)
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PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
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